Preparation and characterization of polycrystalline perovskite materials
Lead-free perovskite has been proved to be an excellent candidate material for the next generation of bio-friendly direct X-ray detectors due to its many advantages.At present,most of the reported perovskite-based ray detectors are mainly single crystal materials.Single crystal materials often have harsh growth conditions and uncontrollable growth processes,and the preparation of large-area high-quality perovskite single crystal materials still faces great challenges.Polycrystalline perovskite materials with simple preparation processes and short cycles are also widely used in the field of optoelectronics.However,the preparation of large-area high-quality perovskite polycrystalline materials on a macro scale still faces great challenges.Here,(CH3NH3)3 Bi2I9 polycrystalline wafers and CH3NH3PbI3 polycrystalline thick films with controllable size were prepared by mechanical hot pressing and slurry coating,respectively.Their microstructure,crystal structure and electrical properties were characterized.The results show that the(CH3 NH3)3 Bi2I9 polycrystalline wafer and CH3NH3PbI3 polycrystalline thick film prepared by hot pressing method and slurry coating method have high crystal quality,compactness and good electrical properties.
metal halide perovskitesX-ray detectorspolycrystalline waferspolycrystalline thick film
万方数据
维普
