Uncertainty evaluation of trace elements Si,Cu,Ti in pure aluminum products by ICP-AES method
This article introduces the uncertainty evaluation of the ICP-AES analysis method for trace ele-ments Si,Cu,and Ti in aluminum products.Firstly,a mathematical model is established,and then the uncertainty components are analyzed in terms of the uncertainty introduced by the repeatability of sample measurement,the uncertainty introduced by sample weighing,the uncertainty introduced by standard solution preparation,and the uncertainty introduced by calibration curve fitting.Finally,the standard uncertainty and extended uncertainty are synthesized,and it is pointed out that the uncertainty introduced by calibration curve fitting and sample repeated measurement has a significant impact on the reliability of ICP-AES determination results.
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维普
