METHOD OF PHOTOVOLTAIC MODULE CRACKED FAULT DIAGNOSIS BASED ON EQUIVALENT CIRCUIT MODEL PARAMETER CALCULATION
Using equivalent circuit model parameter calculations,a new method is proposed to diagnose hidden cracks in photovoltaic modules.It analyzes hidden crack,hot spot,potential induced attenuation(PID),and aging fault mechanisms,studying their impact on module output characteristics and parameter variations.An equivalent circuit model incorporating forward/reverse characteristics is established.From the calculated parameters,diagnostic features for hidden crack diagnosis are determined.Experimental results demonstrate precise fitting of computed parameters to experimental I-V curves.The identified diagnostic features effectively represent hidden crack occurrence and evolution.This method reliably identifies causes and estimates the severity of hidden crack faults.
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