微电子学2024,Vol.54Issue(3) :517-522.DOI:10.13911/j.cnki.1004-3365.230319

电路防护用聚对二甲苯的耐恶劣环境性能研究

Harsh Environment Resistance of Parylene Used to Protect ICs

李菁萱 冯小成 荆林晓 井立鹏 李洪剑 王勇
微电子学2024,Vol.54Issue(3) :517-522.DOI:10.13911/j.cnki.1004-3365.230319

电路防护用聚对二甲苯的耐恶劣环境性能研究

Harsh Environment Resistance of Parylene Used to Protect ICs

李菁萱 1冯小成 1荆林晓 1井立鹏 1李洪剑 1王勇1
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作者信息

  • 1. 北京微电子技术研究所,北京 100076
  • 折叠

摘要

聚对二甲苯具有防潮、气体隔绝、电绝缘等优点,可广泛应用于集成电路领域.文章针对聚对二甲苯的耐恶劣环境性能进行研究,研究其在热氧老化、紫外老化、温度循环及寿命试验条件下的退化情况.结果表明,聚对二甲苯在热氧、紫外等环境下易发生退化,应该避免暴露在此类环境下.在温度循环及寿命试验条件等环境下性能下降不明显,耐电性能仅与沉积厚度有关.

Abstract

Parylene can be widely used in integrated circuits based on its special properties of moisture resistance,gas isolation,and electrical insulation.In this study,we evaluated the resistance of parylene to harsh environments in terms of material degradation under the conditions of thermal oxygen aging,ultraviolet aging,and thermal cycle and life tests.The results of the thermal-oxidative aging and ultraviolet aging tests demonstrate that parylene should not be exposed to such environments because degradation could easily occur.However,the degradation of parylene is unnoticeable under the conditions of thermal cycle and life tests.Furthermore,the results demonstrate that the breakdown resistance is related only to the thickness of the deposited layer and the correlation is positive.

关键词

聚对二甲苯/隔离防护/可靠性评估/环境老化

Key words

parylene/isolation protection/reliability assessment/environment degradation

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出版年

2024
微电子学
四川固体电路研究所

微电子学

CSTPCD北大核心
影响因子:0.274
ISSN:1004-3365
参考文献量7
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