首页|基于FPGA原型验证的深度调试系统设计

基于FPGA原型验证的深度调试系统设计

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现场可编程门阵列(Field Programmable Gate Arrays,FPGA)原型验证是芯片设计中的重要环节,其应用能够显著提升芯片整体验证速度并揭示其他验证方法难以发现的系统设计缺陷.对于FPGA原型验证系统的调试,主流的工具为集成逻辑分析仪,但其存在如下问题:消耗大量块随机存取存储器资源、调试深度较低、基本触发方式少.针对这些问题,提出了一种深度调试系统.与Xilinx公司的集成逻辑分析仪相比,所提调试系统的触发逻辑表达式支持各种逻辑组合,具备更加灵活的触发设置.在采样深度方面,它可以达到400 000 bits,相比集成逻辑分析仪的最大采样深度131 072 bits,提高了205.2%.在采样宽度为200 bits、采样深度为131 072 bits的情况下,只需占用FPGA的10个块随机存取存储器资源,仅为集成逻辑分析仪的1.4%.
Deep Debugging System Design Based on FPGA Prototyping
FPGA prototype validation is a crucial step in chip design,as its application significantly accelerates the overall chip verification speed and reveals system design flaws that are challenging to detect using other validation methods.For debugging FPGA prototype validation systems,the mainstream tool is the integrated logic analyzer,which,however,presents the following issues:substantial consumption of block random access memory resources,low debugging depth,and limited basic triggering methods.In response to these challenges,this study proposes a deep debugging system.In comparison to Xilinx's integrated logic analyzer,the triggering logic expressions of the presented debugging system support various logic combinations,offering flexible triggering settings.Regarding sampling depth,it can reach 400 000 bits,a 205.2%improvement compared with the maximum sampling depth of 131 072 bits of the integrated logic analyzer.In a scenario with a sampling width of 200 bits and sampling depth of 131 072 bits,it only requires the utilization of 10 block random access memory resources on the FPGA,accounting for a mere 1.4%of the integrated logic analyzer's consumption.

deep debuggingprototype verificationfield programmable gate arraysintegrated logic analyzer

吴文会、黄正峰、王贯西、杨滔

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合肥工业大学微电子学院,合肥 230601

无锡亚科鸿禹电子有限公司,江苏无锡 214105

深度调试 原型验证 现场可编程门阵列 集成逻辑分析仪

2024

微电子学
四川固体电路研究所

微电子学

CSTPCD北大核心
影响因子:0.274
ISSN:1004-3365
年,卷(期):2024.54(4)