Single Event Failure Mechanism in a Bandgap Reference Circuit
This article introduces a bipolar switching regulator for space applications that experiences abnormal reference voltages under irradiation via a single particle pulse,interrupting the entire chip output function.After the single particle pulse,abnormalities within the circuit do not get restored,requiring the regulator to be powered off to restore the chip to normal working order.Owing to this experimental phenomena,the working conditions of the device during abnormal situations were analyzed at the circuit level,and the irradiation mechanism at the device level after the single particle irradiation was determined.By conducting high current EM M I experiments on the internal components of the chip in combination with a bipolar bandgap reference circuit,the abnormal working state of the chip caused by the single particle radiation effect was simulated.Furthermore,weak parts of the reference voltage source were identified using device irradiation mechanism and simulation analyses.Layout improvement measures were established base on circuit principles to enhance the single particle irradiation resistance of the reference voltage source.
万方数据
维普
