A functional test method of Ethernet PHY chip based on ZYNQ MPSOC
李睿 1万旺 1焦美荣 1张大宇 1张松 1王贺 1梁培哲1
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作者信息
1. 中国空间技术研究院,北京 100094
折叠
摘要
随着以太网技术和集成电路技术的发展,以太网物理层(Physical Layer,PHY)芯片的速率和性能都得到了极大提升,电路复杂度更是几何级增长,以至于常规的自动测试设备(Automatic Test Equipment,ATE)测试很难充分验证其功能,所以亟需开展相应测试方法研究.提出了一种高效的基于ZYNQ MPSOC的以太网PHY芯片功能测试方法.该方法以ZYNQ MPSOC为核心,设计了一种直达应用层面的系统级测试装置,从而减少了与物理层直接交互的行为,有效降低了测试装置及程序开发难度.经试验验证,提出的基于ZYNQ MPSOC的以太网PHY芯片功能测试方法能够用于以太网PHY芯片测试.
Abstract
With the development of Ethernet technology and integrated circuit technology,the speed and performance of Ethernet Physical Layer(PHY)chips have been significantly enhanced,and the circuit complexity has increased geometrically.It is difficult to fully verify its function in conventional Automatic Test Equipment(ATE)testing,so it is urgent to carry out corresponding test method research.An efficient ZYNQ MPSOC based method for functional testing of Ethernet PHY chip is proposed.A system-level test device is designed directly to the application layer,which reduces the direct interaction with the physical layer and effectively reduces the difficulty of test device and program development.The experimental results show that the ZYNQ MPSOC based method can be used to test the function of Ethernet PHY chip.
关键词
以太网/PHY芯片/ZYNQ/MPSOC/系统级测试装置/PHY芯片测试
Key words
Ethernet/PHY chips/ZYNQ MPSOC/system-level test board/PHY chip testing
维普
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