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基于OpenCV提升电子荷质比的测量精度

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利用计算机视觉库 OpenCV提供的 Hough圆检测方法对塞曼效应实验中光的干涉圆环进行拟合,采用拟合的直径数据计算电子荷质比,并与CCD自带的三点画圆测量干涉圆环直径的方法进行对比.实验结果表明:利用三点画圆方法得到的数据计算电子荷质比的相对偏差为 9.09%,利用 Hough圆检测方法得到的数据计算电子荷质比的相对偏差为 1.13%,有效提升了测量精度.为了提升测量的便捷性,基于 Vue数据双向绑定技术,实现了基于 HTML5 的跨平台交互应用界面,打破了编程语言需要特定运行环境的限制,在该界面中,通过对拟合参量的调节,实现干涉圆环和圆心的同步拟合显示,并将拟合得到的圆心坐标和直径大小直观显示在界面中,方便电子荷质比的计算.
Enhancing measurement accuracy of electron charge-to-mass ratio based on OpenCV
This study focused on improving the measurement accuracy of the electron charge-to-mass ratio by using the computer vision library OpenCV.The Hough circle fitting method provided by OpenCV was utilized to fit the interference rings of the light in the Zeeman effect experiment.The fit-ted diameter data was then used to calculate the electron charge-to-mass ratio.A comparison was made with the three-point circle drawing method provided by the CCD,which was integrated with this experiment.The results demonstrated that the relative error in calculating the electron charge-to-mass ratio using the three-point circle method was 9.09%,while the relative error using the Hough circle detection method was 1.13%.This effectively enhanced the measurement accuracy.In order to im-prove measurement convenience,a cross-platform interactive application interface based on HTML5 was implemented,utilizing the Vue two-way data binding technology.This broke the limitations of programming languages requiring specific runtime environments.In this interface,the synchronization of fitting and displaying the interference rings and their centers was achieved by adjusting the fitting parameters.The fitted coordinates of the centers and the diameters were visually displayed in the in-terface,facilitating the calculation of the electron charge-to-mass ratio.

electron charge-to-mass ratioZeeman effectOpenCVHough circle fittingHT-ML5

邵明珍、张欢、邓冬梅、刘丽莎、王克东、王才林

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南方科技大学理学院 物理系,广东 深圳 518055

南方科技大学人文社会科学学院 语言中心,广东 深圳 518055

电子荷质比 塞曼效应 OpenCV Hough圆检测 HTML5

南方科技大学教学质量与教学改革工程项目(2022)

XJZLGC202223

2024

物理实验
东北师范大学

物理实验

影响因子:0.573
ISSN:1005-4642
年,卷(期):2024.44(4)
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