Imaging measurement of photoelectric characteristics of photoelectric films
The optoelectronic characteristics of optoelectronic films of the photo-detectors are re-lated to the absorption coefficient and optoelectronic conversion coefficient.In order to measure the 2 D distribution of optoelectronic characteristics of optoelectronic films,the measurement method of the photoelectric characteristics based on single pixel spectrum detection imaging was proposed.The pho-toelectric film itself was not only the imaging object but also a signal detector,i.e.,it could realize the self-measuring imaging.Firstly,the four step phase-shifting fringe projection method was used to derive the single pixel imaging formula for optoelectronic characteristics of the film.For the case that a photocell film was used as a test object,white light,red light,green light and blue light were used to perform the 2 D imaging.The results showed that the method could measure the optoelectronic characteristics 2 D distribution of optoelectronic films with a certain spatial resolution,the grayscale average,standard deviation and spectral distribution characteristics in the frequency domainwere could be used to evaluate the conversion strength and the uniformity of optoelectronic characteristics.
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