Research on statistical characteristics of speckle through scattering media
Complex scattering media diffraction usually forms a speckle pattern,which makes it have important application value in fields such as laser technology,electronics and optoelectronics.Thus,a measurement system of speckle through scattering media was set up,and the effects of CCD exposure time,diffraction distance and scattering surface diameter on the statistical characteristics of speckle were studied.The results showed that the speckle characteristics through the scattering media changed with the optical system parameters,and a speckle pattern with the modest contrast ratio and intensity could be obtained by choosing the proper exposure time.The spatial diffraction could be characterized by the average size of the speckle,while the subtle change of the speckle characteristics could be analyzed by means of the correlation coefficient and the digital image correlation result.
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