针对测试车载单元(On Board Unit,OBU)或整车是否具备识别恶意数据的能力以及其恶意数据识别能力是否符合要求的问题,提出了一种恶意数据识别能力测试方法,搭建了蜂窝车联网(Cellular-Vehicle to Everything,C-V2X)信息安全测试系统.根据恶意数据消息的发送主体的合法性、一致性和安全层校验通过情况,将常见恶意数据攻击进行分类.基于分类结果,设计相应测试用例,利用测试设备生成非法安全协议数据单元(Session Primitive Data Unit,SPDU)数据包.C-V2X信息安全测试中包括车用无线通信技术(Vehicle to Everything,V2X)模拟模块、全球导航卫星系统(Global Navigation Satellite System,GNSS)模拟模块、证书授权(Certificate Authority,CA)平台和场景模拟模块等几个部分,在C-V2X模拟模块采用FPGA处理上位机的比特流,并采用数字上变频(Digital Up Converters,DUC)、数字下变频(Digital Down Converter,DDC)和数模转换器(Digital to Analog Converter,DAC)等几个模块完成数据处理.结果表明,所提测试方法可以模拟常见的恶意数据攻击,测试设备生成的合法数据包可以被车辆正常接受,生成的非法数据包部分可以被待测设备识别并丢弃.
C-V2X Vehicle Malicious Data Identification Capability Test Method
In order to test whether On Board Unit(OBU)or vehicle has the capability of identifying malicious data and whether its capability of identifying malicious data meets the requirements,a malicious data identification capability test method is proposed and a Cellular-Vehicle to Ever thing(C-V2X)information security test system is built.The test method first classifies common malicious data attacks according to the legitimacy,consistency and security layer verification of the sender of the malicious data message.Based on the classification results,the corresponding test cases are designed,and the illegal Session Primitive Data Unit(SPDU)packets are generated by the test equipment.C-V2X information security test includes Vehicle to Everything(V2X)analog module,Global Navigation Satellite System(GNSS)analog module,Cerificate Authority(CA)platform,scene analog module,etc.In the C-V2X analog module,FPGA is used to process the bit stream of the upper computer,and several modules such as Digital Up Conversion(DUC),Digital Down Conversion(DDC),Digital to Analog Converter(DAC)are used to complete data processing.The results show that the test method can simulate common malicious data attacks,the legitimate data packets generated by the test equipment can be accepted by the vehicle normally,and the illegal data packets generated can be recognized and discarded by the device to be tested.
国家科技期刊平台
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