A Test Method and Device of IO Functional for SIP Chip
Aiming at the problems of IO function test of SIP chip depends on ATE test machine,which is expensive,inconven-ient to use,and the manual test efficiency is low and easy to make mistakes,a design scheme of IO function test method and de-vice for SIP chip is proposed.Combined with the characteristics of IO function test,the core components of the test method and device are constructed by using auxiliary test module,interconnecting circuit board and upper computer.The system can meet the use of SIP chips with different packaging types.According to the actual test situation,the test startup items can be con-figured arbitrarily to improve the test efficiency,reduce the probability of test errors caused by manual participation,and con-veniently record the test data for later tracking and inspection.
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维普
