When testing integrated circuits on ATE machines,the test conditions of the chip's electrical parameters will exceed the board resources of ATE machines.Therefore,the program control system based on ATE machine is designed by using the characteristics of universal source table with high performance test index.The system and ATE machine can be programmed through simple connection and without writing complex program control instructions.The system can dynamically change the function configuration of the external source table and the sequence of parameter test items to assist the ATE machine to complete continuous automatic test.The test data collected by the source table can be directly sent back to the test data UI interface of the ATE machine for parameter card limit judgment.The experiment proves that the universal source table program control system makes the ATE based program control external source table more concise,test operation more convenient,and significantly improves the chip test efficiency.
ATE testsource table program controlparameter testsystem design
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