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射频器件测量的校准技术分析

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在用矢量网络分析仪(VNA)对射频微波元件进行S参数测量时,由于网分的同轴端口与元器件类似微带的端口无法直接进行测量,故往往引入夹具以实现同轴到微带的过渡.在此过程中,测量结果包含了夹具本身自带的误差,需要用校准技术进行去嵌入(de-embedding).直通-反射-延时线(TRL)是其中一种高精度的校准技术,本文在HFSS中制作了10 MHz-45 GHz的TRL校准件包括"顶层地"传输线,新型共面波导,基片集成波导,两层介质的共面波导等不同结构,去嵌入之后的1pF电容与理想电容在全频段有较好的一致性,并把结果进行对比.下一步模拟了性能更好的同轴连接器,以改善实验的去嵌入结果,验证TRL校准件达到毫米波的可行性方案.
Analysis of Calibration Techniques for RF Device Measurement
When using vector network analyzer to measure the S parameter of microwave RF compo-nents,because the coaxial port of VNA and the port similar to micro-strip of components cannot be measured directly,a fixture is often introduced to realize the transition from coaxial to micros-trip.During this process,the measurement results include errors inherent in the fixture itself,which need to be de-embedding using calibration techniques.The Thru-reflect-line(TRL)is one of the high-precision calibration techniques.In this paper,the 10 MHz-45 GHz TRL calibrators are made in HFSS,including the"top ground"transmission line,the new coplanar waveguide,the substrate inte-grated waveguide,the coplanar waveguide with two layers of media and other different structures.The 1pF capacitance after de-embedding is in good consistency with the ideal capacitance in the full frequency band,and the results are compared.The next step is to simulate a coaxial connector with better performance to improve the de-embedding effect of the experiment and verify the feasibility of TRL calibration components achieving millimeter wave.

TRL calibration technologyMillimeter wave calibration componentPrecision analysis and comparison

吴杰峰

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宁波大学信息科学与工程学院,宁波 315211

TRL校准技术 毫米波校准件 精度分析与对比

2024

无线通信技术
信息产业部电信科学技术第四研究所

无线通信技术

影响因子:0.295
ISSN:1003-8329
年,卷(期):2024.33(1)
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