Accurate Measurement Methodology Study and Instrument Development for Surface Temperature Based on In-situ Measurement of Emissivity
Because the measured surface emissivity is uncertain and the influencing factors are extremely complex,the accu-racy of the high temperature billet surface temperature measurement is uncertain,which is an unsolved problem in the field of in-dustrial process parameter detection.In this paper,a reflector with double probe holes was used to measure the intrinsic radiation and multiple reflected radiation of the surface simultaneously,the dual-wavelength detector converted the received radiation into surface temperature and emissivity in in-situ measurement.The pyrometer was developed and the accuracy verification was imple-mented.A thin film thermocouple was pasted on the measured surfaces for comparison.The results indicate that the average error was 2.6℃at 600～1 000℃,and the measurement errors of the emissivity were 0.023 and 0.007 at two wavelengths.The average standard uncertainty was 1.78℃.Compared with other methods of surface temperature measurement,the accuracy in this paper is significantly improved due to the elimination of assumed emissivity.
emissivitysurface temperature measurementreflectordual-wavelength detectorpyrometeruncertainty
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