仪表技术与传感器2024,Issue(9) :34-38,52.

基于发射率在线测量的表面精确测温方法研究与仪器研制

Accurate Measurement Methodology Study and Instrument Development for Surface Temperature Based on In-situ Measurement of Emissivity

王珺琳 张鸿宇 谢植
仪表技术与传感器2024,Issue(9) :34-38,52.

基于发射率在线测量的表面精确测温方法研究与仪器研制

Accurate Measurement Methodology Study and Instrument Development for Surface Temperature Based on In-situ Measurement of Emissivity

王珺琳 1张鸿宇 1谢植2
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作者信息

  • 1. 沈阳理工大学信息科学与工程学院
  • 2. 东北大学信息科学与工程学院
  • 折叠

摘要

由于被测表面发射率不确定且影响因素极其复杂,使得高温钢坯表面温度测量的准确性不确定,是工业过程参数检测领域一直没有解决的问题.文中采用带有双探测孔的反射器同时测量得到表面固有辐射和多重反射辐射,结合双波长探测器在线测量高温表面的发射率和表面温度.研制了相应的仪器并在高温试样表面进行测量,采用薄膜热电偶作为温度比对标准,测量得到 600~1 000℃的平均误差为2.6℃,两波长下发射率的测量误差分别为 0.023、0.007,标准不确定度为 1.78℃.相比于其他辐射测温方法,文中消除了发射率的假设条件限制,使表面温度的测量准确性明显提高.

Abstract

Because the measured surface emissivity is uncertain and the influencing factors are extremely complex,the accu-racy of the high temperature billet surface temperature measurement is uncertain,which is an unsolved problem in the field of in-dustrial process parameter detection.In this paper,a reflector with double probe holes was used to measure the intrinsic radiation and multiple reflected radiation of the surface simultaneously,the dual-wavelength detector converted the received radiation into surface temperature and emissivity in in-situ measurement.The pyrometer was developed and the accuracy verification was imple-mented.A thin film thermocouple was pasted on the measured surfaces for comparison.The results indicate that the average error was 2.6℃at 600~1 000℃,and the measurement errors of the emissivity were 0.023 and 0.007 at two wavelengths.The average standard uncertainty was 1.78℃.Compared with other methods of surface temperature measurement,the accuracy in this paper is significantly improved due to the elimination of assumed emissivity.

关键词

发射率/表面温度测量/反射器/双波长探测器/辐射测温仪/不确定度

Key words

emissivity/surface temperature measurement/reflector/dual-wavelength detector/pyrometer/uncertainty

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基金项目

辽宁省教育厅高等学校基本科研项目青年项目(1030040000668)

沈阳理工大学引进高层次人才项目(1010147001228)

出版年

2024
仪表技术与传感器
沈阳仪表科学研究院

仪表技术与传感器

CSTPCDCSCD北大核心
影响因子:0.585
ISSN:1002-1841
参考文献量7
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