宇航计测技术2024,Vol.44Issue(1) :34-40.DOI:10.12060/j.issn.1000-7202.2024.01.06

球形敏感单元微瞄准形成金属/空气/金属微观界面中的电子输运机理研究

Study of Electron Tunneling Sensing Mechanism in Metal/Air/Metal Microinterfaces Formed by Microsphere Probing

边星元 赵东方 崔俊宁
宇航计测技术2024,Vol.44Issue(1) :34-40.DOI:10.12060/j.issn.1000-7202.2024.01.06

球形敏感单元微瞄准形成金属/空气/金属微观界面中的电子输运机理研究

Study of Electron Tunneling Sensing Mechanism in Metal/Air/Metal Microinterfaces Formed by Microsphere Probing

边星元 1赵东方 1崔俊宁1
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作者信息

  • 1. 哈尔滨工业大学超精密光电仪器工程研究所,超精密仪器技术及智能化工业和信息化部重点实验室(哈尔滨工业大学),哈尔滨 150080
  • 折叠

摘要

针对惯性陀螺和航空、航天发动机等高端/尖端仪器装备中,深孔、沟槽等内腔体结构的高精度测量对非接触传感方法提出的挑战性需求,展开球形敏感单元瞄准被测件形成金属/空气/金属微观界面中的敏感机理研究.从绝缘介质薄层电子输运机理和绝缘介质性质改变而产生电子输运两个角度,对包括电子隧穿在内的电子输运机理进行形成条件和电流密度特性的分析,揭示球形敏感单元微瞄准形成的金属/空气/金属微观界面中,产生传感电流的电子输运主要机理为福勒-诺德海姆隧穿效应,为探索新原理的三维非接触式纳米传感方法奠定了基础.

Abstract

In order to meet the challenging requirements of high-precision measurement of internal structures such as deep holes and grooves in high-end/cutting-edge instruments and equipments such as inertial gyroscopes and aerospace engines using non-contact sensing methods,research has been conducted on the sensitive mechanisms in the metal/air/metal micro-interface formed by probing a measured part with a spherical sensitive element.From the perspectives of the electron transport mechanism in the thin layer of insulating medium and the change of the insulating medium properties leading to electron transport,various electron transport mechanisms,including electron tunneling,were analyzed in terms of formation conditions and current density characteristics.It was revealed that the Fowler-Nordheim tunneling effect was the main mechanism for the generation of sensing current in the metal/air/metal micro-interface formed by probing with the spherical sensitive element,laying the foundation for exploring a new principle of three-dimensional non-contact nano-sensing methods.

关键词

电子隧穿/金属空气金属微观界面/微球瞄准/纳米传感

Key words

Electron tunneling/Metal-Air-Metal microinterfaces/Microsphere probing/Nano-sensing

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基金项目

国家自然科学基金青年科学基金(52305572)

出版年

2024
宇航计测技术
中国航天科技集团一院102所 二院203所

宇航计测技术

CSTPCDCSCD
影响因子:0.189
ISSN:1000-7202
参考文献量12
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