宇航计测技术2024,Vol.44Issue(4) :17-22.DOI:10.12060/j.issn.1000-7202.2024.04.03

压力传感器温度响应特性校准装置研究

Research on Pressure Sensors Temperature-response Characteristics Calibration Device

高炳涛 孙海涛 霍瑞东 郭一梦 王小三 黄其刚
宇航计测技术2024,Vol.44Issue(4) :17-22.DOI:10.12060/j.issn.1000-7202.2024.04.03

压力传感器温度响应特性校准装置研究

Research on Pressure Sensors Temperature-response Characteristics Calibration Device

高炳涛 1孙海涛 1霍瑞东 1郭一梦 1王小三 1黄其刚1
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作者信息

  • 1. 北京航天计量测试技术研究所,北京 100076
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摘要

为确保测量数据的准确性,需对压力传感器在高低温环境下温度响应特性参数进行校准,通过开展标准压力源、温度隔离单元、多点测温校准腔等系统设计,研制了一套压力传感器温度响应特性校准装置,实现了在-50 ℃至100 ℃环境温度条件下,对绝压2~500 kPa范围内压力传感器校准,校准装置测量不确定度优于0.05%(A=2),为开展压力传感器温度响应特性研究奠定了基础.

Abstract

In order to ensure the accuracy of the measurement data,it is necessary to calibrate the temperature-response characteristics parameters of the pressure sensor under high and low temperature environment.The temperature-response characteristics calibration device for the pressure sensors is developed by designing systems such as the standard pressure sources,the temperature isolation units,and the multi-point temperature measurement calibration chambers.The calibration of the pressure sensors,within the pressure range of absolute pressure 2~500 kPa and under the ambient temperature conditions of-50 ℃~100℃,is realized.The measurement uncertainty of the calibration device is better than 0.05%(k=2),laying the foundation for conducting research on the temperature response characteristics of pressure sensors.

关键词

校准/压力传感器/校准装置

Key words

Calibration/Pressure sensor/Calibration device

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出版年

2024
宇航计测技术
中国航天科技集团一院102所 二院203所

宇航计测技术

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影响因子:0.189
ISSN:1000-7202
参考文献量8
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