Research on Key Technologies for High-frequency Electronic Product Performance Testing and Analysis of Instrument Application
This article comprehensively reviews the development status of key technologies and advanced test instruments in response to the urgent need for performance testing of high-frequency electronic products.Firstly,the article analyzes the major challenges in the field of high-frequency testing,including signal distortion,phase noise,and electromagnetic interference.Then,it elaborates on the core technologies of signal integrity analysis,phase noise measurement,and electromagnetic compatibility(EMC)testing,demonstrating their roles in improving product performance evaluation through practical examples.Furthermore,the article discusses the technical characteristics and application advantages of currently mainstream test instruments,such as vector network analyzers,spectrum analyzers,and real-time spectrum analyzers,providing a basis for selecting suitable test equipment.Through the exploration of test data processing and analysis methods,this study proposes a series of optimization strategies aimed at enhancing the effectiveness and accuracy of testing,contributing to the technological innovation and development of related industries.
NETL
NSTL
万方数据
