首页|用于应力双折射分布测量的多构型扫描系统设计

用于应力双折射分布测量的多构型扫描系统设计

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为了实现对不同构型光学样品进行应力双折射分布测量,在使用双弹光调制方法的基础上,设计了一种应用于双折射分布测量的多构型扫描系统.该系统在保证测量的高分辨率的同时,通过保持激光器静止,同时使样品进行快速移动,提高了测量精度与广度.在样品测量方面,采用 633 nm(1/4)玻片测试,测试相对误差的范围为 0.79%~0.95%,波动范围为 0.12 nm,标准差为 0.035 2;采用BK7玻璃样品测试,波动范围为 0.25 nm,标准差为 0.038 9.在扫描精度方面,连续扫描精度误差不超过 0.05 mm,连续寸动扫描精度误差不超过 0.009 mm.对比实验结果可得出,该多构型扫描系统可有效解决对样品任一区域实现高精度应力双折射测量的问题.
Design of multi-configuration scanning system for stress birefringence distribution measurement
In order to measure the stress birefringence distribution of optical samples with different configurations,a multi-configuration scanning system for birefringence distribution measurement was designed based on the double elastic light modulation method.The system not only ensured the high resolution of the measurement,but improved the measurement accuracy and breadth by keeping the laser stationary and making the sample move quickly.In terms of sample measurement,the 633 nm(1/4)glass was adopted to test,the relative error of the detection results was 0.79%~0.95%,with a variation range of 0.12 nm,and the standard deviation was 0.035 2.The variation range of the BK7 glass sample was 0.25 nm,and the standard deviation of the experimental results was 0.038 9.For scanning accuracy,the continuous scanning accuracy error does not exceed 0.05 mm,and the continuous inching scanning accuracy error is less than 0.009 mm.According to the above two experimental results,it can be concluded that the multi-configuration scanning system can effectively solve the problem of high precision stress birefringence measurement in any area of the sample.

multi-configuration scanning systemelastic light modulationstress birefringencePC computer design

岐临凯、李克武、李坤钰、王志斌、李晋华

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中北大学电气与控制工程学院,山西太原 030051

山西省光电信息与仪器工程技术研究中心,山西太原 030051

中北大学前沿交叉科学研究院,山西太原 030051

中北大学仪器与电子学院,山西太原 030051

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多构型扫描系统 弹光调制 应力双折射 上位机设计

国家自然科学基金山西省自然科学基金

62205310201901D211234

2024

应用光学
中国兵工学会 中国兵器工业第二0五研究所

应用光学

CSTPCD北大核心
影响因子:0.517
ISSN:1002-2082
年,卷(期):2024.45(3)
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