应用光学2024,Vol.45Issue(6) :1270-1276.DOI:10.5768/JAO202445.0605001

红外超宽带分光镜研究

Research on infrared ultrawideband beam splitter

张静 孙文瀚 付秀华 潘永刚 王奔 林兆文 石澎
应用光学2024,Vol.45Issue(6) :1270-1276.DOI:10.5768/JAO202445.0605001

红外超宽带分光镜研究

Research on infrared ultrawideband beam splitter

张静 1孙文瀚 1付秀华 2潘永刚 2王奔 2林兆文 2石澎3
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作者信息

  • 1. 长春理工大学光电工程学院,吉林长春 130052
  • 2. 长春理工大学中山研究院光电工程学院,广东中山 528400
  • 3. 中山火炬职业技术学院光电信息学院,广东中山 528400
  • 折叠

摘要

超宽带分光镜是光谱分析系统中不可缺少的光学元件,其性能直接影响傅里叶红外光谱仪的测试精度.依据光学薄膜理论,选用Ge、ZnSe和YbF3作为镀膜材料,结合基板实际光谱曲线,通过光谱补偿设计方法,结合TF C软件完成膜系设计.采用电子束蒸发离子束辅助沉积技术进行薄膜制备,通过优化沉积工艺,解决了分光镜制备过程中膜厚控制误差大导致光谱差的问题.使用Spectrum Tw o傅里叶红外光谱仪进行检测,在45.入射时,2.5 μm~20 μm波段的平均分光比为52:45.5,且环境测试结果显示,分光镜具有良好的稳定性.

Abstract

Ultra-wideband spectroscope is an indispensable optical component in spectral analysis system,and its performance directly affects the measurement accuracy of Fourier infrared spectrometer.Based on the optical film theory,the Ge,ZnSe and YbF3 were selected as coating materials.The film system design was completed combined with the actual spectrum curves of the substrate,through the spectral compensation design method,and combined with TFC software.The electron beam evaporation and ion beam assisted deposition technology was used to prepare the thin film.Through the optimization of the deposition process,the problem of poor spectrum caused by large film thickness control error during the preparation of the spectroscope was solved.The Spectrum Two Fourier infrared spectrometer was used to detect that the average spectral ratio of 2.5 μm~20 μm band was 52:45.5 at 45° incidence.Through the environmental test,the spectroscope has good stability.

关键词

光学薄膜/宽光谱红外分光镜/光谱分析/膜厚误差

Key words

optical film/wide-spectrum infrared spectroscope/spectral analysis/film thickness error

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出版年

2024
应用光学
中国兵工学会 中国兵器工业第二0五研究所

应用光学

CSTPCD北大核心
影响因子:0.517
ISSN:1002-2082
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