Research on ultrasonic identification of metals based on improved Manhattan distance
Ultrasonic waves interact with the microstructure of metal samples and scattering and reflection effects occur,resulting in a loss of sound energy.The ultrasonic signal is associated with the microstructure and crystal structure of the metal sample,and the concept of"ultrasonic fingerprint"is introduced.The"ultrasonic fingerprint"of each metal sample is unique,and the sampling and retention of the"ultrasonic fingerprint"of a known standard sample is equivalent to putting an"anti-counterfeit label"on it.Three types of metal samples with similar composition and seven metal samples of the same composition in each type were sampled using the sector sweep of the ultrasonic phased array.The improved Manhattan distance is used as the fingerprint feature,and the Gaussian distribution principle and triple standard deviation method are combined to calculate the identification threshold of the standard samples,which is more scientific and reasonable compared with the previous threshold calculation method.The test results show that the proposed method can achieve accurate identification of all metal samples with similar composition or even those with the same composition.