首页|Characterization of Electrical Tree Degradation of Epoxy Resin under Thermal and Temperature Stresses by Photoelastic Effect

Characterization of Electrical Tree Degradation of Epoxy Resin under Thermal and Temperature Stresses by Photoelastic Effect

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Epoxy resin is widely used in the support,insulation,and packaging components of electrical equipment owing to their excellent insulation,thermal,and mechanical properties.However,epoxy-resin insulation often suffers from thermal and mechanical stresses under extreme environmental conditions and a compact design,which can induce electrical tree degradation and insulation failure in electrical equipment.In this study,the photoelastic method is employed to investigate the thermal-mechanical coupling stress dependence of the electrical treeing behavior of epoxy resin.Typical electrical tree growth morphology and stress distribution were observed using the photoelastic method.The correlation between the tree length and overall accumulated damage with an increase in mechanical stress is determined.The results show that compressive stress retards the growth of electrical trees along the electric field,while tensile stress has accelerating effects.This proves that the presence of thermal stress can induce more severe accumulated damage.

Epoxy resinelectrical tree degradationthermal stressmechanical stressphotoelastic effects

Hein Htet Aung、Yuhuai Wang、Jin Li、Ying Zhang、Tatsuo Takada

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School of Electrical and Information Engineering,Tianjin University,Tianjin 300072,China

Department of Power Generation and Transformation Engineering,Baoding Technical College of Electric Power,Baoding 071051,China

Measurement and Electric Machine Control Laboratory,Tokyo City University,Tokyo 158-8557,Japan

National Natural Science Foundation of ChinaScience and Technology Project of Hebei Education Department

52377153QN2023073

2024

中国电气工程学报(英文)

中国电气工程学报(英文)

ISSN:
年,卷(期):2024.10(1)
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