电子科技学刊2024,Vol.22Issue(2) :36-47.DOI:10.1016/j.jnlest.2024.100250

Data augmentation method for insulators based on Cycle-GAN

Run Ye Azzedine Boukerche Xiao-Song Yu Cheng Zhang Bin Yan Xiao-Jia Zhou
电子科技学刊2024,Vol.22Issue(2) :36-47.DOI:10.1016/j.jnlest.2024.100250

Data augmentation method for insulators based on Cycle-GAN

Run Ye 1Azzedine Boukerche 2Xiao-Song Yu 3Cheng Zhang 4Bin Yan 1Xiao-Jia Zhou1
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作者信息

  • 1. School of Automation Engineering,University of Electronic Science and Technology of China,Chengdu,611731,China;Yangtze River Delta Research Institute(Huzhou),University of Electronic Science and Technology of China,Huzhou,313001,China
  • 2. School of Electrical Engineering and Computer Science,University of Ottawa,Ottawa,K1N6N5,Canada
  • 3. School of Automation Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China
  • 4. Yangtze River Delta Research Institute(Huzhou),University of Electronic Science and Technology of China,Huzhou,313001,China
  • 折叠

Abstract

Data augmentation is an important task of using existing data to expand data sets.Using generative countermeasure network technology to realize data augmentation has the advantages of high-quality generated samples,simple training,and fewer restrictions on the number of generated samples.However,in the field of transmission line insulator images,the freely synthesized samples are prone to produce fuzzy backgrounds and disordered samples of the main insulator features.To solve the above problems,this paper uses the cycle generative adversarial network(Cycle-GAN)used for domain conversion in the generation countermeasure network as the initial framework and uses the self-attention mechanism and channel attention mechanism to assist the conversion to realize the mutual conversion of different insulator samples.The attention module with prior knowledge is used to build the generation countermeasure network,and the generative adversarial network(GAN)model with local controllable generation is built to realize the directional generation of insulator belt defect samples.The experimental results show that the samples obtained by this method are improved in a number of quality indicators,and the quality effect of the samples obtained is excellent,which has a reference value for the data expansion of insulator images.

Key words

Data expansion/Deep learning/Generate confrontation network/Insulator

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出版年

2024
电子科技学刊
电子科技大学

电子科技学刊

影响因子:0.154
ISSN:1674-862X
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