符合AEC-Q100标准的车规级芯片筛选测试方法研究
Method of screening and testing methods for automotive grade chips in compliance with AEC-Q100 standards
刘伟 1王西国 1王延斌1
作者信息
- 1. 北京中电华大电子设计有限责任公司,射频识别芯片检测技术北京市重点实验室
- 折叠
摘要
随着新能源以及无人驾驶汽车的迅速发展,车规级芯片的作用愈加重要.本文介绍了符合AEC-Q100标准的车规级芯片筛选方法,首先对AEC-Q100汽车芯片质量标准体系进行概述.之后详细介绍了符合AEC-Q001和AEC-Q002标准的基于统计学的筛选方法,以及基于空间位置的异常点检测方法,分别介绍了在晶圆测试和封装测试阶段的筛选流程.该方法已成功应用于车规级芯片筛选测试当中.
Abstract
With the rapid development of new energy and autonomous vehicles,the role of automotive grade chips is becoming increasingly important.This article introduces the screening method for automotive chips that comply with the AEC-Q100 standard,and provides an overview of the quality standard system for AEC-Q100 automotive chips.Afterwards,a detailed introduction was given to the statistical based screening scheme that meets the AEC-Q001 and AEC-Q002 standards,as well as the anomaly detection method based on spatial location.The screening processes in the wafer testing and packaging testing stages were respectively introduced.This scheme has been successfully applied in the screening and testing of automotive grade chips.
关键词
AEC-Q/车规级芯片/筛选测试Key words
AEC-Q/Automotive Grade Chip/screening test引用本文复制引用
出版年
2024
NETL
NSTL
维普
万方数据