Method of screening and testing methods for automotive grade chips in compliance with AEC-Q100 standards
With the rapid development of new energy and autonomous vehicles,the role of automotive grade chips is becoming increasingly important.This article introduces the screening method for automotive chips that comply with the AEC-Q100 standard,and provides an overview of the quality standard system for AEC-Q100 automotive chips.Afterwards,a detailed introduction was given to the statistical based screening scheme that meets the AEC-Q001 and AEC-Q002 standards,as well as the anomaly detection method based on spatial location.The screening processes in the wafer testing and packaging testing stages were respectively introduced.This scheme has been successfully applied in the screening and testing of automotive grade chips.
NETL
NSTL
万方数据
维普
