支持非接触时钟自适应功能测试的仿真器设计
A Simulator Design Supporting Function Test of Adaptive Clock based on Non-contact Interface
王延斌1
作者信息
- 1. 北京中电华大电子设计有限责任公司,射频识别芯片检测技术北京市重点实验室
- 折叠
摘要
本文提出了一种支持非接触时钟自适应功能测试的仿真器设计,仿真器通过仿真器管理模块和仿真器硬件实现能量通路选择和能量变化控制,提供给芯片仿真模块变化的能量,以实现芯片时钟自适应功能的测试.本设计支持非接触接口正常通信功能,同时支持能量随机变化的时钟自适应功能测试.通过仿真器内部控制能量大小的变化,不需要人工或自动装置移动设备来改变能量的大小,操作简便节约成本,提高了开发和测试效率.
Abstract
This paper proposes a simulator design supporting function test of adaptive clock based on non-contact interface.The simulator realizes energy-path selection and energy-change control through management module and hardware of the simulator,thereby providing changing energy to the chip simulation module to achieve the function test of adaptive clock.The design supports normal communication function of non-contact interface,and supports clock function test of random energy change.Through the internal control of the simulator,there is no need for manual or automatic device equipment to change the scale of the energy,which is simple to operate,save cost,as well as improves the efficiency of development and test.
关键词
场强能量/时钟自适应/非接触接口Key words
field-intensity energy/adaptive clock/non-contact interface引用本文复制引用
出版年
2024
NETL
NSTL
维普
万方数据