In IC final testing process,it will lead to a big excursion of device mix,due to double device in testing socket.So,there are many kind of way to detect the double device,but all the ways are not so robust.Plant a mini LED under the testing socket will obviously improve the detecting rate,this solution is easy and low cost,suitable to all kind of thin thickness IC.
关键词
集成电路测试/插座/残留(叠料)/微型发光二极管/摄像头
Key words
IC testing/socket/residual(double device)/mini LED/camera
维普
万方数据