基于锁相环与分频器实现ATE频率扩展的研究
The Research on Frequency Extension of ATE Based on Phase-Locked Loop and Frequency Divider
李敬胶 1冉翠翠 1苏洋 1常艳昭1
作者信息
摘要
在当今高度竞争的市场环境中,对成本的敏感性不断提高,在电子制造业,高速板卡资源的紧张状况与产能的增长需求形成了尖锐矛盾,迫切需要一种能替代高速板卡的经济高效的测试方案.本文采用LMXxxx锁相环电路和HMCxxx分频器电路的新方法,能够扩展ATE板卡频率的能力,以实现在低速ATE机台上测试高速芯片.这一新颖方法成功突破了低速ATE机台最大测试800 MHz的瓶颈,为高速电路的测试带来了新的可能.
Abstract
In today's highly competitive market environment,cost sensitivity is continuously increasing.In the electronics manufacturing industry,the tension between the scarcity of high-speed board resources and the demand for increased production capacity creates a critical contradiction,urgently necessitating an economical and efficient testing solution to replace high-speed boards.This paper introduces a novel approach utilizing the LMXxxx phase-locked loop circuit and HMCxxx frequency divider circuit,which can extend the frequency capability of ATE boards,enabling the testing of high-speed chips on low-speed ATE machines.This innovative method successfully breaks the 800 MHz maximum testing bottleneck of low-speed ATE machines,providing new possibilities for high-speed circuit testing.
关键词
锁相环/分频器/频率扩展Key words
phase-locked loop/frequency divider/frequency extension引用本文复制引用
出版年
2024
NETL
NSTL
万方数据