Nor Flash可靠性同测系统设计方法与实现
Design Method and Implementation of Nor Flash Reliability Testing System
董攀 1王延斌1
作者信息
- 1. 北京中电华大电子设计有限责任公司,射频识别芯片检测技术北京市重点实验室
- 折叠
摘要
本文首先介绍了 Nor Flash的广泛应用以及可靠性评价的重要性,对目前评价方法和系统装置存在的缺点进行了分析.并针对Nor Flash当前的应用场景进行分析继而设计和实现了一套Nor Flash可靠性测试系统,最后对该系统在射频识别芯片检测技术北京市重点实验室进行了验证,并对其不足提出了未来发展建议.
Abstract
This paper first introduces the widespread application of Nor Flash and the importance of reliability evalu-ation,and analyzes the shortcomings of current evaluation methods and system devices.And based on the analysis of the current application scenarios of Nor Flash,a Nor Flash reliability testing system was designed and implemented.Finally,the system was validated in the Beijing Key Laboratory of RFID chip detection technology,and future devel-opment suggestions were proposed for its shortcomings.
关键词
闪存/USB集线器/可编程逻辑阵列/微控制器/物联网Key words
Nor Flash/USBHUB/FPGA/MCU/IoT引用本文复制引用
出版年
2024
NETL
NSTL
万方数据