基于ATE的高速存储器测试技术研究
High Speed Memory Testing Methods Based on ATE
谈元伟 1李敬胶 1常艳昭 1苏洋1
作者信息
摘要
DDR3芯片是一种能最高支持1600 Mbps传输速率的高速存储器芯片,本文对该类芯片的功能描述,寄存器配置进行介绍,针对ATE(Automated Test Equipment,自动测试设备)测试机台设计了相应的硬件Loadboard,最后在ATE测试机台上进行了速度等级测试,测试结果验证了 DDR3芯片在最高频率1600Mbps下的功能正确性,运用shmoo进行绘制眼图,分析DDR3的信号完整性,为DDR3芯片测试提供了一定的参考.
Abstract
DDR3 is a high-speed memory chip that can support up to 1600Mbps transmission rate.This article describes the functions and register configurations of this type of chip and designs corresponding peripheral circuits for ATE(Automated Test Equipment)testing machine.Finally,speed grade testing was conducted on the ATE testing machine,and the test results verified the correctness of the DDR3 chip's function at the highest frequency of 1600Mbps.Shmoo was used to draw eye diagrams and analyze the signal integrity of DDR3,providing a certain refer-ence for DDR3 chip testing.
关键词
DDR3/寄存器编写/功能测试/自动测试设备Key words
DDR3/register programing/functional testing/eye pattern引用本文复制引用
出版年
2024
NETL
NSTL
万方数据