首页|New speckle pattern interferometry for precise in situ deformation measurements
New speckle pattern interferometry for precise in situ deformation measurements
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A new electronic speckle pattern interferometry method is proposed to realize in situ deformation measurements.The feature of the method is the combination of a high-speed camera and multiple laser Doppler vibrometers[LDVs]for syn-chronous measurements.The high-speed camera is used to record and select effective interferograms,while the LDVs are used to measure the rigid body displacement caused by vibrations.A series of effective interferograms with known shifted phase values are obtained to calculate the deformation phase.The experimental results show that the method performs well in measuring static and dynamic deformations with high accuracy in vibrating environments.
CAS Key Laboratory of Mechanical Behavior and Design of Materials,Department of Modern Mechanics,University of Science and Technology of China,Hefei 230027,China
Shenzhen Key Laboratory of Intelligent Optical Measurement and Detection,College of Physics and Optoelectronic Engineering,Shenzhen University,Shenzhen 518060,China
National Natural Science Foundation of ChinaNational Natural Science Foundation of China
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