首页|Current status and development of CMOS SiPM for scintillator-based radiation detectors toward all-digital sensors[Invited]

Current status and development of CMOS SiPM for scintillator-based radiation detectors toward all-digital sensors[Invited]

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Modern scintillator-based radiation detectors require silicon photomultipliers[SiPMs]with photon detection efficiency higher than 40％at 420 nm,possibly extended to the vacuum ultraviolet[VUV]region,single-photon time resolution[SPTR]＜100 ps,and dark count rate[DCR]＜150 kcps/mm2.To enable single-photon time stamping,digital electronics and sensitive microcells need to be integrated in the same CMOS substrate,with a readout frame rate higher than 5 MHz for arrays extending over a total area up to 4 mm × 4 mm.This is challenging due to the increasing doping concentrations at low CMOS scales,deep-level carrier generation in shallow trench isolation fabrication,and power consumption,among others.The advances at 350 and 110 nm CMOS nodes are benchmarked against available SiPMs obtained in CMOS and commercial customized technologies.The concept of digital multithreshold SiPMs with a single microcell readout is finally reported,proposing a possible direction toward fully digital scintillator-based radiation detectors.

silicon photomultipliercomplementary metal-oxide semiconductordigital SiPM

Nicola D'Ascenzo、胡文韬、劳慧、华越轩、张博、房磊、奚道明、郑睿、邱奥、Emanuele Antonecchia、凌怡清、刘雨晴、李琰、俞航、肖鹏、谢庆国

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Wuhan National Laboratory for Optoelectronics,Wuhan 430074,China

Biomedical Engineering Department,Huazhong University of Science and Technology,Wuhan 430074,China

RAYQUANT Technology Co.,Ltd.,Ezhou 436044,China

RAYSOLUTION Healthcare Co.,Ltd.,Hefei 230000,China

RAYMEASURE Technology Co.,Ltd.,Suzhou 215000,China

RAYCAN Technology Co.,Ltd.,Suzhou 215000,China

College of Computer Science and Software Engineering,Shenzhen University,Shenzhen 518060,China

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国家自然科学基金国家自然科学基金国家自然科学基金Sino-German Mobility Programme

622500026202780862027801M-0387

2024

10.3788/COL202422.020021

中国光学快报(英文版)
中国光学学会 中国科学院上海光学精密机械研究所

中国光学快报(英文版)

CSTPCD
影响因子：1.305
ISSN：1671-7694
年,卷(期)：2024.22(2)
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