首页|Characterization of the current crowding effect on chip surface using a quantum wide-field microscope
Characterization of the current crowding effect on chip surface using a quantum wide-field microscope
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We characterize the current crowding effect for microwave radiation on a chip surface based on a quantum wide-field microscope combining a wide-field reconstruction technique.A swept microwave signal with the power of 0-30 dBm is supplied to a dumbbell-shaped microstrip antenna,and the significant differences in microwave magnetic-field amplitudes attributed to the current crowding effect are experimentally observed in a 2.20 mm × 1.22 mm imaging area.The normalized microwave magnetic-field amplitude along the horizontal geometrical center of the image area further demonstrates the feasibility of the characterization of the current crowding effect.The experiments indicate the proposal can be qualified for the characterization of the anomalous area of the radio-frequency chip surface.
current crowding effectmicrowave field on chip surfacequantum wide-field microscopenitrogen-vacancy center
赵锐、王丁、温焕飞、石云波、唐军、刘俊
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Science and Technology on Electronic Test & Measurement Laboratory,North University of China,Taiyuan 030051,China
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