Flat-top beam illumination for polarization-sensitive second-harmonic generation microscopy

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外文摘要：Wide-field second-harmonic generation[SHG]was used to obtain the second-harmonic signal from the entire image area for rapid imaging,despite the fact that conventional Gaussian beam illumination has low energy utilization efficiency,which makes it easy to overexpose the intensity of the image center area.However,flat-top beam illumination has uniform spatial distribution,thereby improving the photon excitation efficiency in the entire image region and reducing laser damage and thermal effect.By combining flat-top beam illumination and wide-field SHG polarization measurement,we can calculate more myosin fibril symmetrical axis orientations through polarization analysis of 16 images at a fast imaging speed while expanding the field of view.More importantly,the application of a flat-top beam can further improve the capability of polarization measurement in SHG microscopy.

外文关键词：

flat-top beamsecond-harmonic generationmuscle structure

作者：

王冰、李响、余文慧、沈炳林、胡睿、屈军乐、刘丽炜

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作者单位：

State Key Laboratory of Radio Frequency Heterogeneous Integration,Shenzhen University,Shenzhen 518060,China

Key Laboratory of Optoelectronic Devices and Systems of Guangdong Province and Ministry of Education,College of Physics and Optoelectronic Engineering,Shenzhen University,Shenzhen 518060,China

出版年：

2024

DOI：

10.3788/COL202422.061701

中国光学快报(英文版)

中国光学学会中国科学院上海光学精密机械研究所

中国光学快报(英文版)

CSTPCD

影响因子：1.305

ISSN：1671-7694

年,卷(期)：2024.22(6)