首页|Characterization of single-pulse photon energy and photon energy jitter at the Shanghai soft X-ray Free-Electron Laser
Characterization of single-pulse photon energy and photon energy jitter at the Shanghai soft X-ray Free-Electron Laser
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维普
The X-ray free-electron laser[XFEL],a new X-ray light source,presents numerous opportunities for scientific research.Self-amplified spontaneous emission[SASE]is one generation mode of XFEL in which each pulse is unique.In this paper,we propose a pinhole diffraction method to accurately determine the XFEL photon energy,pulses'photon energy jitter,and sample-to-detector distance for soft X-ray.This method was verified at Shanghai soft X-ray Free-Electron Laser[SXFEL].The measured average photon energy was 406.5 eV,with a photon energy jitter[root-mean-square]of 1.39 eV,and the sample-to-detector distance was calculated to be 16.61 cm.
X-ray free-electron laserself-amplified spontaneous emissionphoton energy characterizationphoton energy jitterXFEL single-pulse diffraction
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