中国机械工程2024,Vol.35Issue(12) :2203-2210.DOI:10.3969/j.issn.1004-132X.2024.12.013

砷化镓解理加工的划片过程仿真分析及工艺研究

Simulation Analysis and Process Study of Scribing Processes for GaAs Cleavage Processing

张庆正 姜晨 高睿 蒋金鑫
中国机械工程2024,Vol.35Issue(12) :2203-2210.DOI:10.3969/j.issn.1004-132X.2024.12.013

砷化镓解理加工的划片过程仿真分析及工艺研究

Simulation Analysis and Process Study of Scribing Processes for GaAs Cleavage Processing

张庆正 1姜晨 1高睿 2蒋金鑫1
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作者信息

  • 1. 上海理工大学机械工程学院,上海,200093
  • 2. 香港理工大学工业及系统工程系超精密加工技术国家重点实验室,香港,999077
  • 折叠

摘要

为有效提高砷化镓(GaAs)基半导体激光芯片巴条谐振腔面解理加工质量,开展了一种新型点划方式的划片仿真分析及工艺实验.建立GaAs划片过程的有限元仿真模型,根据不同划片工艺,研究划片载荷及应力分布情况;开展解理工艺验证实验,分析解理面形貌特征,对划片工艺进行验证.研究结果表明,优化后的工艺方法(即由内向外点划片)可有效降低划片过程材料表面损伤程度,减少脆性断裂现象,实验结果与仿真结果具有较高的一致性.

Abstract

In order to effectively improve the quality of GaAs-based semiconductor laser cavity mirrors,a new type of scribing method was proposed and carried out in simulation analysis and pro-cessing experiments.A finite element simulation model of the scribing processes of GaAs materials was established to optimize the existing processing methods and to investigate the distribution of scri-bing loads and stresses under different processes.A cleavage processing validation experiment was car-ried out to analyze the morphological characteristics of the cleavage surfaces.It is found that the opti-mized processing method,which involves scribing from the inside out,can effectively reduce the de-gree of material surface damages in the scribing processes and reduce the brittle fracture phenomenon.The experimental results were in high consistency with the simulation ones.

关键词

半导体激光器/谐振腔面/砷化镓解理加工/有限元分析

Key words

semiconductor laser/resonant cavity surface/GaAs cleavage processing/finite element analysis

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出版年

2024
中国机械工程
中国机械工程学会

中国机械工程

CSTPCDCSCD北大核心
影响因子:0.678
ISSN:1004-132X
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