首页|集成电路未来发展与关键问题——第347期"双清论坛(青年)"学术综述

集成电路未来发展与关键问题——第347期"双清论坛(青年)"学术综述

扫码查看
集成电路是信息时代重要的技术基础,也是国家战略竞争力的重要标志。在全球范围内,集成电路技术正处于快速变革与创新的新时期。面向集成电路未来发展,需要针对先进器件及集成工艺、模拟与混合电路、电路设计方法、新型计算架构等方面开展前沿研究,加强规划布局,完善创新系统,推动我国集成电路产业在未来发展中占得先机。基于第347期"双清论坛(青年)",本文总结了我国集成电路科学研究及产业发展面临的国家重大需求,研判分析了集成电路领域国内外的发展态势和关键问题,展望了该领域重大的前沿发展趋势,探讨了前沿研究方向和科学基金资助战略,以期助推我国集成电路技术高质量发展。
Integrated circuit technology:future development and key issues-review of the 347th"Shuangqing Forum(Youth)"
The Integrated circuit(IC)is the critical technical foundation of the information age and a key indicator of national competitiveness.The field of IC technology is experiencing a rapid transformation and innovation globally.For the future development of ICs,it is necessary to conduct ground-breaking research in the areas of advanced devices and integration processes,analog and mixed-signal circuits,circuit design methodologies,and new computer architectures.This approach is vital for strengthening strategic planning and enhancing the innovation ecosystem,positioning China to gain a competitive advantage in the future development of the IC industry.Based on the 347th"Shuangqing Forum(Youth)",this paper provides a comprehensive summary of the significant national demands of China's IC scientific research and industrial development.It analyzes domestic and foreign development trends and critical issues in the IC field.The paper also looks forward to the major frontier development trends in IC and discusses the research directions and scientific funding support strategies to promote the high-quality development of China's IC technology,aligning it with global standards and future needs

integrated circuitadvanced integration and packaginganalog and radio-frequency circuitelectronic design automationnovel computer architecture

陈云霁、蔡一茂、汪玉、唐华、何杰、刘克、郝跃

展开 >

中国科学院计算技术研究所,北京 100190

北京大学集成电路学院,北京 100871

清华大学电子工程系,北京 100084

国家自然科学基金委员会信息科学部,北京 100085

西安电子科技大学微电子学院,西安 710071

展开 >

集成电路 先进集成封装工艺 模拟与射频电路 电子设计自动化 新型体系架构

2024

中国科学F辑
中国科学院,国家自然科学基金委员会

中国科学F辑

CSTPCD北大核心
影响因子:1.438
ISSN:1674-5973
年,卷(期):2024.54(1)
  • 50