Overview of the Current Research in Measurement and Characterization for Atomic Level Manufacturing
Atomic level manufacturing refers to the advanced manufacturing technology that applies energy to atoms directly,achieving controlled removal of atomic level materials or large-scale manipulation and assembly of atomic/molecular-level structures.This technology enables the leap in product performance and functionality.It is an advanced manufacturing technology that can be large-scale and mass-produced.Atomic level manufacturing requires precise manipulation of atoms at a spatial scale of 10-10 meters.The bonding time and electron dynamics changes of atoms during the manufacturing process occur in the range of femtosecond(10-15 seconds)to attosecond(10-18 seconds).Therefore,it is required to measure and characterize the atomic level manufacturing process with ultrafast time and ultra-space resolution for accurately understanding and utilizing the new principles and effects at atomic scale,ensuring the accessibility and controllablility of atomic level manufacturing;Achieving high throughput and large-scale online monitoring of the atomic level manufacturing process is essential to ensure its reliability.Therefore,atomic level manufacturing measurement and characterization refer to the precise measurement and characterization of materials,structures,or devices at the atomic level in terms of time,space,and energy scales.This is crucial to guarantee the accessibility,controllability,and reliability of atomic level manufacturing.This article introduces the state of the art of measurement and characterization methods for atomic level manufacturing,summarizes three important points for future research:observation of atomic level ultrafast dynamic processes,in-situ characterization of atomic structure evolution,and online quality monitoring of atomic level manufacturing processes.Current challenges in measurement and characterization of atomic level manufacturing and suggestions for future development are also discussed in the article.
measuring and characterization for atomic level manufacturingultra high spatiotemporal resolutiondynamic characterization of atomic structure evolutionin-process measurement of atomic level manufacturing