首页|A 4H-SiC trench IGBT with controllable hole-extracting path for low loss

A 4H-SiC trench IGBT with controllable hole-extracting path for low loss

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A novel 4H-SiC trench insulated gate bipolar transistor(IGBT)with a controllable hole-extracting(CHE)path is proposed and investigated in this paper.The CHE path is controlled by metal semiconductor gate(MES gate)and metal oxide semiconductor gate(MOS gate)in the p-shield region.The grounded p-shield region can significantly suppress the high electric field around gate oxide in SiC devices,but it weakens the conductivity modulation in the SiC trench IGBT by rapidly sweeping out holes.This effect can be eliminated by introducing the CHE path.The CHE path is pinched off by the high gate bias voltage at on-state to maintain high conductivity modulation and obtain a comparatively low on-state voltage(VON).During the turn-off transient,the CHE path is formed,which contributes to a decreased turn-off loss(EOFF).Based on numerical simulation,the EOFF of the proposed IGBT is reduced by 89％compared with the conventional IGBT at the same VON and the VON of the proposed IGBT is reduced by 50％compared to the grounded p-shield IGBT at the same EOFF.In addition,the average power reduction for the proposed device can be 51.0％to 81.7％and 58.2％to 72.1％with its counterparts at a wide frequency range of 500 Hz to 10 kHz,revealing a great improvement of frequency characteristics.

controllable hole-extracting pathenergy lossfrequency characteristicsSiC insulated gate bipolar transistor(IGBT)

Lijuan Wu、Heng Liu、Xuanting Song、Xing Chen、Jinsheng Zeng、Tao Qiu、Banghui Zhang

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Hunan Provincial Key Laboratory of Flexible Electronic Materials Genome Engineering,Changsha University of Science&Technology,Changsha 410114,China

Hunan Provincial Natural Science Foundation of ChinaScientific Research Fund of Hunan Provincial Education DepartmentHunan Provincial Key Laboratory of Flexible Electronic Materials Genome Engineering's Open Fund Project-2020

2021JJ3073819K001202016

2023

10.1088/1674-1056/ac8722

中国物理B(英文版)
中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDCSCD北大核心EI
影响因子：0.995
ISSN：1674-1056
年,卷(期)：2023.32(4)
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