中国物理B(英文版)2024,Vol.33Issue(1) :716-722.DOI:10.1088/1674-1056/ad0719

Quantitative determination of the critical points of Mott metal-insulator transition in strongly correlated systems

牛月坤 倪煜 王建利 陈雷鸣 邢晔 宋筠 冯世平
中国物理B(英文版)2024,Vol.33Issue(1) :716-722.DOI:10.1088/1674-1056/ad0719

Quantitative determination of the critical points of Mott metal-insulator transition in strongly correlated systems

牛月坤 1倪煜 2王建利 3陈雷鸣 3邢晔 3宋筠 4冯世平4
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作者信息

  • 1. School of Physical Science and Technology,Inner Mongolia University,Hohhot 010021,China
  • 2. College of Physics and Electronic Information,Yunnan Normal University,Kunming 650500,China
  • 3. School of Materials Science and Physics,China University of Mining and Technology,Xuzhou 221116,China
  • 4. Department of Physics,Beijing Normal University,Beijing 100875,China
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Abstract

Mottness is at the heart of the essential physics in a strongly correlated system as many novel quantum phenomena occur in the metallic phase near the Mott metal-insulator transition.We investigate the Mott transition in a Hubbard model by using the dynamical mean-field theory and introduce the local quantum state fidelity to depict the Mott metal-insulator transition.The local quantum state fidelity provides a convenient approach to determining the critical point of the Mott transition.Additionally,it presents a consistent description of the two distinct forms of the Mott transition points.

Key words

critical point/metal-insulator transition/local quantum state fidelity/strongly correlated system/quasiparticle coherent weight

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基金项目

Scientific Research Foundation for Youth Academic Talent of Inner Mongolia University(10000-23112101/010)

Fundamental Research Funds for the Central Universities of China(JN200208)

National Natural Science Foundation of China(11474023)

National Key Research and Development Program of China(2021YFA1401803)

National Natural Science Foundation of China(11974051)

National Natural Science Foundation of China(11734002)

出版年

2024
中国物理B(英文版)
中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDEI
影响因子:0.995
ISSN:1674-1056
参考文献量52
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