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Single event effects evaluation on convolution neural network in Xilinx 28 nm system on chip

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Convolutional neural networks(CNNs)exhibit excellent performance in the areas of image recognition and object detection,which can enhance the intelligence level of spacecraft.However,in aerospace,energetic particles,such as heavy ions,protons,and alpha particles,can induce single event effects(SEEs)that lead CNNs to malfunction and can significantly impact the reliability of a CNN system.In this paper,the MNIST CNN system was constructed based on a 28 nm system-on-chip(SoC),and then an alpha particle irradiation experiment and fault injection were applied to evaluate the SEE of the CNN system.Various types of soft errors in the CNN system have been detected,and the SEE cross sections have been calculated.Furthermore,the mechanisms behind some soft errors have been explained.This research will provide technical support for the design of radiation-resistant artificial intelligence chips.

single event effectsconvolutional neural networksalpha particlesystem on chipfault injection

赵旭、杜雪成、熊旭、马超、杨卫涛、郑波、周超

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School of Nuclear Science and Technology,University of South China,Hengyang 421001,China

School of Microelectronics,Xidian University,Xi'an 710071,China

National Natural Science Foundation of ChinaNatural Science Foundation of Hunan Province of ChinaNatural Science Foundation of Hunan Province of ChinaNatural Science Foundation of Hunan Province of ChinaResearch Foundation of Education Bureau of Hunan Province of ChinaScience and Technology Innovation Program of Hunan ProvinceNatural Science Basic Research Plan in the Shaanxi Province of ChinaDoctoral Research Fund of University of South China

123053032023JJ405202021JJ404442019JJ3001920A4302020RC30542023-JC-QN-0015

2024

10.1088/1674-1056/ad3b82

中国物理B(英文版)
中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDEI
影响因子：0.995
ISSN：1674-1056
年,卷(期)：2024.33(7)
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