首页|Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science

Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science

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Transmission electron microscopy(TEM)offers unparalleled atomic-resolution imaging of complex materials and heterogeneous structures.However,high-energy imaging electrons can induce structural damage,posing a challenge for electron-beam-sensitive materials.Cryogenic TEM(Cryo-TEM)has revolutionized structural biology,enabling the vi-sualization of biomolecules in their near-native states at unprecedented detail.The low electron dose imaging and stable cryogenic environment in Cryo-TEM are now being harnessed for the investigation of electron-beam-sensitive materials and low-temperature quantum phenomena.Here,we present a systematic review of the interaction mechanisms between imag-ing electrons and atomic structures,illustrating the electron beam-induced damage and the mitigating role of Cryo-TEM.This review then explores the advancements in low-dose Cryo-TEM imaging for elucidating the structures of organic-based materials.Furthermore,we showcase the application of Cryo-TEM in the study of strongly correlated quantum materials,including the detection of charge order and novel topological spin textures.Finally,we discuss the future prospects of Cryo-TEM,emphasizing its transformative potential in unraveling the complexities of materials and phenomena across diverse scientific disciplines.

cryogenic TEMlow dose imagingquantum materials

王刚、林君浩

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Department of Physics and Shenzhen Key Laboratory of Advanced Quantum Functional Materials and Devices,Southern University of Science and Technology,Shenzhen 518055,China

Quantum Science Center of Guangdong-Hong Kong-Macao Greater Bay Area(Guangdong),Shenzhen 518045,China

National Natural Science Foundation of ChinaGuangdong Innovative and Entrepreneurial Research Team ProgramShenzhen Science and Technology ProgramShenzhen Science and Technology ProgramScience,Technology and Innovation Commission of Shenzhen Municipality

119741562019ZT08C044KQTD2019092917381500020200925161102001ZDSYS20190902092905285

2024

10.1088/1674-1056/ad5af0

中国物理B(英文版)
中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDEI
影响因子：0.995
ISSN：1674-1056
年,卷(期)：2024.33(8)