Symmetry quantification and segmentation in STEM imaging through Zernike moments

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外文摘要：We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning trans-mission electron microscopy(STEM)images,aimed at improving structural analysis of materials at the atomic scale.This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quan-tum defects.We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS2,enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects.This approach en-hances the analysis of structural variations in crystalline materials,marking a notable advancement in the characterization of structures in materials science.

外文关键词：

scanning transmission electron microscopy(STEM)symmetrysegmentation

作者：

Jiadong Dan、Cheng Zhang、赵晓续、N.Duane Loh

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作者单位：

Department of Biological Sciences,National University of Singapore,Singapore

Center for Bioimaging Sciences(CBIS),National University of Singapore,Singapore

Department of Physics,National University of Singapore,Singapore

School of Materials Science and Engineering,Peking University,Beijing 100871,China

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基金：

National Research Foundation(Competitive Research Program)National University of Singapore Early Career Research AwardEric and Wendy Schmidt AI in Science Postdoctoral Fellowship,a Schmidt Sciences program

项目编号：

NRF-CRP16-2015-05

出版年：

2024

DOI：

10.1088/1674-1056/ad51f4

中国物理B(英文版)

中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDEI

影响因子：0.995

ISSN：1674-1056

年,卷(期)：2024.33(8)