Abstract
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning trans-mission electron microscopy(STEM)images,aimed at improving structural analysis of materials at the atomic scale.This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quan-tum defects.We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS2,enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects.This approach en-hances the analysis of structural variations in crystalline materials,marking a notable advancement in the characterization of structures in materials science.
基金项目
National Research Foundation(Competitive Research Program)(NRF-CRP16-2015-05)
National University of Singapore Early Career Research Award()
Eric and Wendy Schmidt AI in Science Postdoctoral Fellowship,a Schmidt Sciences program()
NETL
NSTL
万方数据