首页|Revealing the microstructures of metal halide perovskite thin films via advanced transmission electron microscopy
Revealing the microstructures of metal halide perovskite thin films via advanced transmission electron microscopy
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Metal halide perovskites(MHPs)are excellent semiconductors that have led to breakthroughs in applications in thin-film solar cells,detectors,and light-emitting diodes due to their remarkable optoelectronic properties and defect tolerance.However,the performance and stability of MHP-based devices are significantly influenced by their microstructures includ-ing the formation of defects,composition fluctuations,structural inhomogeneity,etc.Transmission electron microscopy(TEM)is a powerful tool for direct observation of microstructure at the atomic-scale resolution and has been used to cor-relate the microstructure and performance of MHP-based devices.In this review,we highlight the application of TEM techniques in revealing the microstructures of MHP thin films at the atomic scale.The results provide critical understand-ing of the performance of MHP devices and guide the design of strategies for improving the performance and stability of MHP devices.
perovskitedefectinhom ogeneitytransm ission electron microscopy
冼业铭、王晓明、鄢炎发
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Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and Commercialization,The University of Toledo,Toledo,Ohio 43606,United States
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