首页|Visualizing extended defects at the atomic level in a Bi2Sr2CaCu2O8+δ superconducting wire

Visualizing extended defects at the atomic level in a Bi2Sr2CaCu2O8+δ superconducting wire

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The microstructure significantly influences the superconducting properties.Herein,the defect structures and atomic arrangements in high-temperature Bi2Sr2CaCu2O8+δ(Bi-2212)superconducting wire are directly characterized via state-of-the-art scanning transmission electron microscopy.Interstitial oxygen atoms are observed in both the charge reservoir layers and grain boundaries in the doped superconductor.Inclusion phases with varied numbers of CuO2 layers are found,and twist interfaces with different angles are identified.This study provides insights into the structures of Bi-2212 wire and lays the groundwork for guiding the design of microstructures and optimizing the production methods to enhance superconducting performance.

superconductormicrostructuredefectscanning transmission electron microscopy

胡柯钧、王帅、李泊玉、刘影、葛炳辉、宋东升

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Information Materials and Intelligent Sensing Laboratory of Anhui Province,Key Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of Education,Institutes of Physical Science and Information Technology,Anhui University,Hefei 230601,China

2024

中国物理B(英文版)
中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDEI
影响因子:0.995
ISSN:1674-1056
年,卷(期):2024.33(9)