中国物理B(英文版)2024,Vol.33Issue(11) :1-11.DOI:10.1088/1674-1056/ad7aff

Physics through the microscope

Stephen J.Pennycook Ryo Ishikawa 武海军 赵晓续 黎长建 Duane Loh Jiadong Dan 周武
中国物理B(英文版)2024,Vol.33Issue(11) :1-11.DOI:10.1088/1674-1056/ad7aff

Physics through the microscope

Stephen J.Pennycook 1Ryo Ishikawa 2武海军 3赵晓续 4黎长建 5Duane Loh 6Jiadong Dan 6周武7
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作者信息

  • 1. School of Physical Sciences and CAS Key Laboratory of Vacuum Physics,University of Chinese Academy of Sciences,Beijing 100049,China;Department of Materials Science and Engineering,University of Tennessee,Knoxville,TN,37996,USA
  • 2. Institute of Engineering Innovation,University of Tokyo,Tokyo 113-8656,Japan
  • 3. State Key Laboratory for Mechanical Behavior of Materials,Xi'an Jiaotong University,Xi'an 710049,China
  • 4. School of Materials Science and Engineering,Peking University,Beijing 100871,China
  • 5. Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen 518055,China
  • 6. Department of Physics,National University of Singapore,Singapore 117551,Singapore;Department of Biological Sciences,National University of Singapore,Singapore 117558,Singapore
  • 7. School of Physical Sciences and CAS Key Laboratory of Vacuum Physics,University of Chinese Academy of Sciences,Beijing 100049,China
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Abstract

The electron microscope provides numerous insights into physics,from demonstrations of fundamental quantum mechanical principles to the physics of imaging and materials.It reveals the atomic and electronic structure of key regions such as defects and interfaces.We can learn the underlying physics governing properties,and gain insight into how to synthesize new materials with improved properties.Some recent advances and possible future directions are discussed.

Key words

scanning transmission electron microscopy/materials science/point defects/artificial intelligence

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出版年

2024
中国物理B(英文版)
中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDEI
影响因子:0.995
ISSN:1674-1056
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