In situ non-destructive measurement of Josephson junction resistance using fritting contact technique

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外文摘要：Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films,making them unsuitable for frequency measurements of superconducting qubits.In this study,we present a custom probe station measurement system that employs the fritting contact technique to achieve in situ,non-destructive measurements of Josephson junction resistance.Our experimental results demonstrate that this method allows for accurate prediction of qubit frequency with an error margin of 17.2 MHz.Moreover,the fritting contact technique does not signifi-cantly affect qubit coherence time or the integrity of the superconducting film,confirming its non-destructive nature.This innovative approach provides a dependable foundation for frequency tuning and addressing frequency collision issues,thus supporting the advancement and practical deployment of superconducting quantum computing.

外文关键词：

non-destructivefritting contactqubit frequencyJosephson junction resistance

作者：

杜磊、陶浩然、郭亮亮、张海峰、陈勇、田昕、张驰、贾志龙、段鹏、郭国平

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作者单位：

CAS Key Laboratory of Quantum Information,University of Science and Technology of China,Hefei 230026,China

CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics,University of Science and Technology of China,Hefei 230026,China

Origin Quantum Computing Technology(Hefei)Co.,Ltd.,Hefei 230088,China

出版年：

2024

DOI：

10.1088/1674-1056/ad73b6

中国物理B(英文版)

中国物理学会和中国科学院物理研究所

中国物理B(英文版)

CSTPCDEI

影响因子：0.995

ISSN：1674-1056

年,卷(期)：2024.33(11)