中国物理快报(英文版)2024,Vol.41Issue(10) :70-77.DOI:10.1088/0256-307X/41/10/106301

Theoretical Models on Interfacial Thermal Conductance of Nanoscale Solid Interfaces in Chips:A Mini Review

宗志成 陈显栋 严斌 谢业磊 庞健 李光耀 胡继强 吴志鹏 李博 方海生 杨诺
中国物理快报(英文版)2024,Vol.41Issue(10) :70-77.DOI:10.1088/0256-307X/41/10/106301

Theoretical Models on Interfacial Thermal Conductance of Nanoscale Solid Interfaces in Chips:A Mini Review

宗志成 1陈显栋 2严斌 2谢业磊 2庞健 2李光耀 2胡继强 1吴志鹏 1李博 1方海生 1杨诺1
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作者信息

  • 1. School of Energy and Power Engineering,Huazhong University of Science and Technology,Wuhan 430074,China
  • 2. Department of Packaging and Testing Institution,Sanechips Technology Co.,Ltd.,Shenzhen 518055,China;State Key Laboratory of Mobile Network and Mobile Multimedia Technology,ZTE Corporation,Shenzhen 518055,China
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Abstract

With the rapid increase in power density of electronic devices,thermal management has become urgent for the electronics industry.Controlling temperature in the back-end-of-line is crucial for maintaining the reliability of integrated circuits,where many atomic-scale interfaces exist.The theoretical models of interface thermal conductance not only accurately predict the values but also help to analyze the underlying mechanism.This review picks up and introduces some representative theoretical models considering interfacial roughness,elastic and inelastic processes,and electron-phonon couplings,etc.Moreover,the limitations and problems of these models are also discussed.

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基金项目

Department of Packaging and Testing Institution of Sanechips()

出版年

2024
中国物理快报(英文版)
中国科学院物理研究所,中国物理学会

中国物理快报(英文版)

CSTPCDCSCDEI
影响因子:0.515
ISSN:0256-307X
参考文献量66
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