Objective:Single photon emission computed tomography system base cadmium zinc tellurium(CZT)semiconductor crystal detector,the intrinsic spatial linearity parameter of the detector is related to the physical characteristics of CZT semiconductor crystal,the detectors does not need complex arithmetic circuit and position circuit for calculation and positioning,there is no need for regular calibration or repeated testing and reporting of intrinsic spatial linearity.Methods:According to the test description and related requirements of intrinsic spatial linearity in Section 2.2 of NEMA NU-1 standard,combined with CZT semiconductor crystal detector size,set up the experimental test method.Results:The experimental results show that the intrinsic spatial linearity of CZT semiconductor crystal detector is within the acceptable range.Conclusion:The intrinsic spatial linearity of CZT semiconductor crystal detector is only related to the physical properties of the crystal,the equipment has no complex computing circuit and position circuit for calculation and positioning,SPECT base CZT semiconductor crystal detectors does not need regular calibration or repeated intrinsic spatial linearity test and report.
维普
万方数据
