The Role of Vacuum Technology in Analytical Technology:Application of TOF-SIMS to the Characterization of Mineral Samples
The study of mineral samples is the basis of mineralogy,petrology,mineral deposit and other geological disciplines.The surface morphology,element composition and distribution characteristics of minerals can reveal the source of ore-forming materials,ore-forming process and geological history.This paper describes the principle,technical advantages and vacuum condition of TOF-SIMS,which has wide application potential for mineral sample characterization,focuses on summarizing the research progress and existing problems of the application of TOF-SIMS by domestic and foreign scholars in mineral identification,mineral imaging,quantitative analysis and in-depth analysis of mineral composition and mineral processing,and makes prospects in related fields.
mineral characterizationtime-of-flight secondary ion mass spectrometryimaging analysis
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