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倒装LED微小焊点空洞对其性能的影响

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利用SnCu0.7 锡膏回流工艺制备倒装LED,针对于焊点微小化引起的焊接缺陷.采用X-ray检测分选出不同空洞率焊点,系统研究了空洞率对于接头键合强度的影响规律及回流焊后接头断口特征,通过有限元仿真;探究空洞率对于芯片散热能力影响特性,同时,本文设计了结温测量实验,验证了仿真结果的准确性.最后通过高温老化实验,深入探究不同空洞率LED样品光通量及光电转换效率变化趋势.结果表明:焊点接头键合强度不完全取决于空洞的数量,空洞的大小及其位置对接头键合强度也会有一定的影响,其次随着空洞率逐渐增大,焊点的断裂模式逐渐由韧性断裂转变为脆韧性混合断裂.随着空洞率增大,LED在正常工作下的芯片结温基本呈线性增长趋势,并且空洞率越大,芯片表现出的散热能力越差,当空洞率约为 5%,芯片结温为 41.472℃,当空洞率为30%时,芯片结温达到45.969℃.随着空洞率增加,光通量与光电转换效率在高温老化开始阶段呈上升趋势,在500 h后光通量开始逐渐下降,在 1 500h节点 5%空洞率样品光通量维持率为 93.22%比 30%空洞率样品的82.37%高10.85%,5%空洞率样品光效为42.5%比30%空洞率样品的30.5%高12%.
The Effect of Tiny Voids on the Performance of LED Solder Joints
Using SnCu0.7 solder paste for reflow soldering process to prepare flip-chip LEDs,addressing welding defects caused by the miniaturization of solder joints.The study utilized X-ray Inspection to categorizes solder joints with different void rates.It systematically investigated the influence of void rate on the bonding strength of joints and the fracture characteristics of joints after reflow soldering,through finite element simulation.Furthermore,it explored the impact of void rate on chip heat dissipation capability.Additionally,the paper designed a junction temperature measurement experiment to validate the accuracy of the simulation results.Finally,through high-temperature aging experiments,the study delved into the variation trends of luminous flux and photoelectric conversion efficiency of LED samples with different void rates.The results indicate that the bonding strength of solder joints is not solely determined by the quantity of voids;the size and location of voids also have a certain impact on the bonding strength.Furthermore,as the void rate increases,the fracture mode of solder joints gradually shifts from ductile fracture to brittle-ductile mixed fracture.With the increase in void rate,the chip junction temperature of LEDs under normal operation shows a generally linear growth trend.Moreover,as the void rate increases,the chip's heat dissipation capability deteriorates.When the void rate is approximately 5%,the chip's junction temperature is 41.472℃,whereas when the void rate is 30%,the chip's junction temperature reaches 45.969℃.As the void rate increases,the luminous flux and photoelectric conversion efficiency show an initial upward trend during the early stage of high-temperature aging.After 500 h,the luminous flux gradually begins to decline.At the 1 500 h mark,the maintenance rate of luminous flux for samples with a 5%void rate is 93.22%,which is 10.85%higher than that of samples with a 30%void rate,which is 82.37%.Similarly,the luminous efficacy of samples with a 5%void rate is 42.5%,which is 12%higher than that of samples with a 30%void rate,which is 30.5%.

mini-LED flip solder jointshear strengththermal simulation analysisphotoelectric performance

汤健生、王善林、卢鹏

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南昌航空大学 江西省航空构件成形与连接重点实验室,江西 南昌 330036

江西兆驰光电有限公司,江西 南昌 330036

LED倒装焊点 剪切强度 热学仿真分析 光电性能

江西省自然科学基金

20232ACB204020

2024

照明工程学报
中国照明学会

照明工程学报

影响因子:0.745
ISSN:1004-440X
年,卷(期):2024.35(3)
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